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Scanning Probe Microscopy and Electrical Transport Studies of Ferroelectric Thin Films and 2D van der Waals Materials
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Copyright Title

Scanning Probe Microscopy and Electrical Transport Studies of Ferroelectric Thin Films and 2D van der Waals Materials

Status

Published

on 12 Dec 2017
Year of Creation
2017
Copyright Claimant
Zhiyong Xiao
Registration Number
TX0008527497
on 12 Dec 2017

Copyright Summary


The U.S. Copyright record (Registration Number: TX0008527497) dated 12 Dec 2017, pertains to an electronic file (eService) titled "Scanning Probe Microscopy and Electrical Transport Studies of Ferroelectric Thin Films and 2D van der Waals Materials" created in 2017. The copyright holder is Zhiyong Xiao, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Zhiyong Xiao.

Copyright Details


Copyright Claimant
Zhiyong Xiao

Application Details


Registration Number
TX0008527497
Registration Date
12/12/2017
Year of Creation
2017
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Electronic file (eService)
First Publication Nation
United States

Personal Authors


Notes


Rights Note: Mark Dill, ProQuest-CSA, LLC, 789 E. Eisenhower Parkway, Ann Arbor, MI, 48108-3218, United States, (800) 521-0600, disspub@proquest.com

Statements


Application Title Statement: Scanning Probe Microscopy and Electrical Transport Studies of Ferroelectric Thin Films and 2D van der Waals Materials
Author Statement: Zhiyong Xiao Citizenship: United States Authorship: text
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