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Visit USCONano-characterization of gas cluster ion beam-processed gallium antimonide substrate surface by atomic force microscopy and X-ray photoelectron spectroscopy
Text Registration
Copyright Title
Nano-characterization of gas cluster ion beam-processed gallium antimonide substrate surface by atomic force microscopy and X-ray photoelectron spectroscopy
Status
Published
on 14 Jun 2007
Year of Creation
2002
Copyright Claimant
Xianglin Li
Registration Number
TX0005632801
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0005632801) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Nano-characterization of gas cluster ion beam-processed gallium antimonide substrate surface by atomic force microscopy and X-ray photoelectron spectroscopy" created in 2002. The copyright holder is Xianglin Li, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Xianglin Li.
Application Details
Registration Number
TX0005632801
Registration Date
6/14/2007
Year of Creation
2002
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Computer text data
Notes
Rights Note: Rights and permissions info. on CORDS appl. in CO
Bibliographic Note: Electronic registration
Statements
Author Statement: entire text: Xianglin Li
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