Characterization of silicon surfaces by ellipsometry, atomic force microscopy (AFM), and auger electron spectroscopy (AES)

Text Registration

Characterization of silicon surfaces by ellipsometry, atomic force microscopy (AFM), and auger electron spectroscopy (AES)

Status

Published

on 14 Jun 2007

Year of Creation

1996

Sung-jen Fang

Registration Number

TX0004509035

on 14 Jun 2007

The U.S. Copyright record (Registration Number: TX0004509035) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Characterization of silicon surfaces by ellipsometry, atomic force microscopy (AFM), and auger electron spectroscopy (AES)" created in 1996. The copyright holder is Sung-jen Fang, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Sung-jen Fang.

Sung-jen Fang

Application Details

Registration Number

TX0004509035

Registration Date

6/14/2007

Year of Creation

1996

Agency Marc Code

DLC-CO

Record Status

New

Physical Description

Microfiche

Personal Authors

Sung-jen Fang

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