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Visit USCOContributions of the stresses in the interlevel dielectrics (ILD's) to the reliability of A1 based multilevel metallizations
Text Registration
Copyright Title
Contributions of the stresses in the interlevel dielectrics (ILD's) to the reliability of A1 based multilevel metallizations
Status
Published
on 14 Jun 2007
Year of Creation
1993
Copyright Claimant
Sumanta Kumar Ghosh
Registration Number
TX0003975586
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0003975586) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Contributions of the stresses in the interlevel dielectrics (ILD's) to the reliability of A1 based multilevel metallizations" created in 1993. The copyright holder is Sumanta Kumar Ghosh, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Sumanta Kumar Ghosh.
Application Details
Registration Number
TX0003975586
Registration Date
6/14/2007
Year of Creation
1993
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Microfiche
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