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Phase-Field Modeling of Electromigration-Mediated Morphological Evolution of Voids in Interconnects
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Copyright Title

Phase-Field Modeling of Electromigration-Mediated Morphological Evolution of Voids in Interconnects

Status

Published

on 4 Jun 2020
Year of Creation
2020
Copyright Claimant
Sree Shivani Vemulapalli
Registration Number
TX0008883440
on 4 Jun 2020

Copyright Summary


The U.S. Copyright record (Registration Number: TX0008883440) dated 4 Jun 2020, pertains to an electronic file (eService) titled "Phase-Field Modeling of Electromigration-Mediated Morphological Evolution of Voids in Interconnects" created in 2020. The copyright holder is Sree Shivani Vemulapalli, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Sree Shivani Vemulapalli.

Copyright Details


Copyright Claimant
Sree Shivani Vemulapalli

Application Details


Registration Number
TX0008883440
Registration Date
6/4/2020
Year of Creation
2020
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Electronic file (eService)
First Publication Nation
United States

Notes


Rights Note: Mark Dill, ProQuest, LLC, 789 E. Eisenhower Parkway, Ann Arbor, MI, 48108-3218, United States, (800) 521-0600, disspub@proquest.com

Statements


Application Title Statement: Phase-Field Modeling of Electromigration-Mediated Morphological Evolution of Voids in Interconnects
Author Statement: Sree Shivani Vemulapalli Authorship: text
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