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Journal of Micro/Nanopatterning, Materials, and Metrology [Published: 2021-06-30. Issue: vol. 20, no. 2, 06/30/2021]
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Serial Registration
Copyright Title

Journal of Micro/Nanopatterning, Materials, and Metrology [Published: 2021-06-30. Issue: vol. 20, no. 2, 06/30/2021]

Status

Published

on 26 Jul 2021
Year of Creation
2021
Copyright Claimant
SPIE
Registration Number
TX0009000139
on 26 Jul 2021

Copyright Summary


The U.S. Copyright record (Registration Number: TX0009000139) dated 26 Jul 2021, pertains to an electronic file (eService) titled "Journal of Micro/Nanopatterning, Materials, and Metrology [Published: 2021-06-30. Issue: vol. 20, no. 2, 06/30/2021]" created in 2021. The copyright holder is SPIE, known for their creative contributions in serial registration. For any inquiries concerning this copyrighted material, kindly reach out to SPIE.

Copyright Details


Copyright Claimant
SPIE

Application Details


Registration Number
TX0009000139
Registration Date
7/26/2021
Year of Creation
2021
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
SPIE
First Publication Nation
United States
ISSN
1932-5150
Preexisting Material
Text- previously published articles

Corporate Authors


Notes


Rights Note: SPIE, PO Box 10, Bellingham, WA, 98227-0010, United States
Copyright Local Holdings: vol. 20, no. 2, 06/30/2021 Created 2021 Pub. 2021-06-30 Reg. 2021-07-26 TX0009000139 SCUR
Material Matter Claimed Note: Compilation of articles

Statements


Application Title Statement: Journal of Micro/Nanopatterning, Materials, and Metrology
Author Statement: SPIE employer for hire Domicile: United States Citizenship: United States Authorship: Collective Work Authorship
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