Proceedings of SPIE- 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment [Published: 2019-01-18. Issue: vol. 10839, 26-29 June 2018]

Serial Registration

Proceedings of SPIE- 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment [Published: 2019-01-18. Issue: vol. 10839, 26-29 June 2018]

Status

Published

on 2 May 2019

Year of Creation

2019

SPIE

Registration Number

TX0008766630

on 2 May 2019

The U.S. Copyright record (Registration Number: TX0008766630) dated 2 May 2019, pertains to an electronic file (eService) titled "Proceedings of SPIE- 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment [Published: 2019-01-18. Issue: vol. 10839, 26-29 June 2018]" created in 2019. The copyright holder is SPIE, known for their creative contributions in serial registration. For any inquiries concerning this copyrighted material, kindly reach out to SPIE.

SPIE

Application Details

Registration Number

TX0008766630

Registration Date

5/2/2019

Year of Creation

2019

Agency Marc Code

DLC-CO

Record Status

New

Corporate Author

SPIE

First Publication Nation

United States

ISSN

0277-786X

Corporate Authors

SPIE

Notes

Rights Note: SPIE, PO Box 10, Bellingham, WA, 98227-0010, United States

Statements

Application Title Statement: Proceedings of SPIE- 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment

Author Statement: SPIE employer for hire Domicile: United States Citizenship: United States Authorship: Collective Work Authorship and Component Work(s) authored or fully owned by the Collective Work Author

Notes

Rights Note: SPIE, PO Box 10, Bellingham, WA, 98227-0010, United States

Statements

Application Title Statement: Proceedings of SPIE- 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment

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