X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II [Published: 2014-10-10. Issue: vol. 9210, 18-19 August 2014]

Serial Registration

X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II [Published: 2014-10-10. Issue: vol. 9210, 18-19 August 2014]

Status

Published

on 1 Dec 2014

Year of Creation

2014

SPIE

Registration Number

TX0007961621

on 1 Dec 2014

The U.S. Copyright record (Registration Number: TX0007961621) dated 1 Dec 2014, pertains to an electronic file (eService) titled "X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II [Published: 2014-10-10. Issue: vol. 9210, 18-19 August 2014]" created in 2014. The copyright holder is SPIE, known for their creative contributions in serial registration. For any inquiries concerning this copyrighted material, kindly reach out to SPIE.

SPIE

Application Details

Registration Number

TX0007961621

Registration Date

12/1/2014

Year of Creation

2014

Agency Marc Code

DLC-CO

Record Status

New

Corporate Author

SPIE

First Publication Nation

United States

ISBN

9781628412376

Corporate Authors

SPIE

Notes

Rights Note: SPIE, PO Box 10, Bellingham, WA, 98227-0010, United States, (360) 676-3290

Copyright Local Holdings: vol. 9210, 18-19 August 2014 ISBN 9781628412376 Created 2014 Pub. 2014-10-10 Reg. 2014-12-09 TX0007961621 JMOO

Statements

Application Title Statement: X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II

Author Statement: SPIE employer for hire Domicile: United States Citizenship: United States Authorship: contribution(s) to a collective work

Notes

Rights Note: SPIE, PO Box 10, Bellingham, WA, 98227-0010, United States, (360) 676-3290

Copyright Local Holdings: vol. 9210, 18-19 August 2014 ISBN 9781628412376 Created 2014 Pub. 2014-10-10 Reg. 2014-12-09 TX0007961621 JMOO

Statements

Application Title Statement: X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II

Author Statement: SPIE employer for hire Domicile: United States Citizenship: United States Authorship: contribution(s) to a collective work

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