Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III [Published: 2013-05-17. Issue: vol. 8777, 15-18 April 2013]

Serial Registration

Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III [Published: 2013-05-17. Issue: vol. 8777, 15-18 April 2013]

Status

Published

on 5 Aug 2013

Year of Creation

2013

SPIE

Registration Number

TX0007733962

on 5 Aug 2013

The U.S. Copyright record (Registration Number: TX0007733962) dated 5 Aug 2013, pertains to an electronic file (eService) titled "Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III [Published: 2013-05-17. Issue: vol. 8777, 15-18 April 2013]" created in 2013. The copyright holder is SPIE, known for their creative contributions in serial registration. For any inquiries concerning this copyrighted material, kindly reach out to SPIE.

SPIE

Application Details

Registration Number

TX0007733962

Registration Date

8/5/2013

Year of Creation

2013

Agency Marc Code

DLC-CO

Record Status

New

Corporate Author

SPIE

First Publication Nation

United States

ISBN

9780819495792

Corporate Authors

SPIE

Notes

Rights Note: SPIE, PO Box 10, Bellingham, WA, 98227-0010, United States, (360) 676-3290

Copyright Local Holdings: vol. 8777, 15-18 April 2013 ISBN 9780819495792 Created 2013 Pub. 2013-05-17 Reg. 2013-08-12 TX0007733962 PSTAN

Statements

Application Title Statement: Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III

Author Statement: SPIE employer for hire Domicile: United States Citizenship: United States Authorship: contribution(s) to a collective work

Notes

Rights Note: SPIE, PO Box 10, Bellingham, WA, 98227-0010, United States, (360) 676-3290

Copyright Local Holdings: vol. 8777, 15-18 April 2013 ISBN 9780819495792 Created 2013 Pub. 2013-05-17 Reg. 2013-08-12 TX0007733962 PSTAN

Statements

Application Title Statement: Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III

Author Statement: SPIE employer for hire Domicile: United States Citizenship: United States Authorship: contribution(s) to a collective work

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