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Advances in Metrology for X-Ray and EUV Optics III [Published: 2010-08-23. Issue: vol. 7801, 01 August 2010]
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Serial Registration
Copyright Title

Advances in Metrology for X-Ray and EUV Optics III [Published: 2010-08-23. Issue: vol. 7801, 01 August 2010]

Status

Published

on 1 Oct 2010
Year of Creation
2010
Copyright Claimant
SPIE
Registration Number
TX0007236131
on 1 Oct 2010

Copyright Summary


The U.S. Copyright record (Registration Number: TX0007236131) dated 1 Oct 2010, pertains to an electronic file (eService) titled "Advances in Metrology for X-Ray and EUV Optics III [Published: 2010-08-23. Issue: vol. 7801, 01 August 2010]" created in 2010. The copyright holder is SPIE, known for their creative contributions in serial registration. For any inquiries concerning this copyrighted material, kindly reach out to SPIE.

Copyright Details


Copyright Claimant
SPIE

Application Details


Registration Number
TX0007236131
Registration Date
10/1/2010
Year of Creation
2010
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
SPIE
First Publication Nation
United States
ISBN
9780819482976

Corporate Authors


Notes


Rights Note: SPIE, PO Box 10, Bellingham, WA, 98227-0010, United States, (360) 676-3290
Copyright Local Holdings: vol. 7801, 01 August 2010 ISBN 9780819482976 Created 2010 Pub. 2010-08-23 Reg. 2010-10-12 TX0007236131 JMOO

Statements


Application Title Statement: Advances in Metrology for X-Ray and EUV Optics III
Author Statement: SPIE employer for hire Domicile: United States Citizenship: United States Authorship: Entire work
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