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Integrated circuit metrology, inspection, and process control, IV 5-6 March 1990, San Jose, California William H. Arnold, chair/editor ; sponsored by SPIE--the international society for optical engineering
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Copyright Title

Integrated circuit metrology, inspection, and process control, IV 5-6 March 1990, San Jose, California William H. Arnold, chair/editor ; sponsored by SPIE--the international society for optical engineering

Status

Published

on 14 Jun 2007
Year of Creation
1990
Registration Number
TX0002891299
on 14 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0002891299) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Integrated circuit metrology, inspection, and process control, IV 5-6 March 1990, San Jose, California William H. Arnold, chair/editor ; sponsored by SPIE--the international society for optical engineering" created in 1990. The copyright holder is Society of Photo-Optical Instrumentation Engineers, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Society of Photo-Optical Instrumentation Engineers.

Copyright Details


Application Details


Registration Number
TX0002891299
Registration Date
6/14/2007
Year of Creation
1990
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Society of Photo-Optical Instrumentation Engineers
Series Statement
SPIE proceedings series v. 1261

Personal Authors


Statements


Author Statement: Society of Photo-Optical Instrumentation Engineers, employer for hire
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