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Integrated circuit metrology, inspection, and process control IX 20-22 February 1995, Santa Clara, California Marylyn H. Bennett, chair/editor
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Copyright Title

Integrated circuit metrology, inspection, and process control IX 20-22 February 1995, Santa Clara, California Marylyn H. Bennett, chair/editor

Status

Published

on 14 Jun 2007
Year of Creation
1995
Registration Number
TX0004101274
on 14 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0004101274) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Integrated circuit metrology, inspection, and process control IX 20-22 February 1995, Santa Clara, California Marylyn H. Bennett, chair/editor" created in 1995. The copyright holder is Society of Photo-Optical Instrumentation Engineers (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Society of Photo-Optical Instrumentation Engineers (employer for hire).

Application Details


Registration Number
TX0004101274
Registration Date
6/14/2007
Year of Creation
1995
Place of First Publication
Bellingham, WA
Publisher Name
SPIE
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Society of Photo-Optical Instrumentation Engineers
Physical Description
514 p
Series Statement
SPIE proceedings series vol. 2439

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