The application of electron beam technique for semiconductor surface and metal conductor interface characterization

Text Registration

The application of electron beam technique for semiconductor surface and metal conductor interface characterization

Status

Published

on 14 Jun 2007

Year of Creation

1993

Shyh-nung Steve Lin, 1959

Registration Number

TX0003898141

on 14 Jun 2007

The U.S. Copyright record (Registration Number: TX0003898141) dated 14 Jun 2007, pertains to an electronic file (eService) titled "The application of electron beam technique for semiconductor surface and metal conductor interface characterization" created in 1993. The copyright holder is Shyh-nung Steve Lin, 1959, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Shyh-nung Steve Lin, 1959.

Shyh-nung Steve Lin, 1959

Application Details

Registration Number

TX0003898141

Registration Date

6/14/2007

Year of Creation

1993

Agency Marc Code

DLC-CO

Record Status

New

Physical Description

Microfiche

Personal Authors

Shyh-nung Steve Lin

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