Silicon design solutions: 6T bit cell test structures (cell char blocks) TXu1802817

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Silicon design solutions: 6T bit cell test structures (cell char blocks) TXu1802817

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V3627D520

on 20 Nov 2015

The U.S. Copyright record (Recordation Number: V3627D520) dated 20 Nov 2015, pertains to an electronic file (eService) titled "Silicon design solutions: 6T bit cell test structures (cell char blocks) TXu1802817. The copyright holder is , known for their creative contributions in recorded documents. For any inquiries concerning this copyrighted material, kindly reach out to .

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32Mb - radiation-hardened single-port SRAM design review I & 5 other titles

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Application Details

Registration Number

V3627D520

Registration Date

11/20/2015

Agency Marc Code

DLC-CO

Record Status

New

Personal Authors

32Mb - radiation-hardened single-port SRAM design review I & 5 other titles

V 00362752000000

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