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Visit USCOFrom contamination to defects, faults and yield loss simulation and applications by Jitendra B. Khare, Wojciech Maly
Text Registration
Copyright Title
From contamination to defects, faults and yield loss simulation and applications by Jitendra B. Khare, Wojciech Maly
Status
Published
on 14 Jun 2007
Year of Creation
1996
Copyright Claimant
Kluwer Academic Publishers
Registration Number
TX0004252439
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0004252439) dated 14 Jun 2007, pertains to an electronic file (eService) titled "From contamination to defects, faults and yield loss simulation and applications by Jitendra B. Khare, Wojciech Maly" created in 1996. The copyright holder is Kluwer Academic Publishers, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Kluwer Academic Publishers.
Application Details
Registration Number
TX0004252439
Registration Date
6/14/2007
Year of Creation
1996
Place of First Publication
Boston
Publisher Name
Kluwer Academic Publishers
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
150 p
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