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Copyright Title
Using capacitance to quantify planar geometry variances for micro electro mechanical systems structures
Status
Published
on 9 Dec 2010
Year of Creation
2009
Copyright Claimant
Joo Lien Chee
Registration Number
TX0006707282
on 9 Dec 2010Copyright Summary
The U.S. Copyright record (Registration Number: TX0006707282) dated 9 Dec 2010, pertains to an electronic file (eService) titled "Using capacitance to quantify planar geometry variances for micro electro mechanical systems structures" created in 2009. The copyright holder is Joo Lien Chee, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Joo Lien Chee.
Application Details
Registration Number
TX0006707282
Registration Date
12/9/2010
Year of Creation
2009
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Computer text data
Notes
Rights Note: Rights and permissions info. on CORDS appl. in CO
Local Copyright Note: Electronic registration
Statements
Author Statement: entire text: Joo Lien Chee
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