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Visit USCOA procedure for measuring P-channel MOSFET negative bias temperature instabilities JESD90
Text Registration
Copyright Title
A procedure for measuring P-channel MOSFET negative bias temperature instabilities JESD90
Status
Published
on 15 Jun 2007
Year of Creation
2004
Copyright Claimant
JEDEC Solid State Technology Association
Registration Number
TX0006096394
on 15 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0006096394) dated 15 Jun 2007, pertains to an electronic file (eService) titled "A procedure for measuring P-channel MOSFET negative bias temperature instabilities JESD90" created in 2004. The copyright holder is JEDEC Solid State Technology Association, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to JEDEC Solid State Technology Association.
Application Details
Registration Number
TX0006096394
Registration Date
6/15/2007
Year of Creation
2004
Agency Marc Code
DLC-CO
Record Status
Changed
Notes
Bibliographic Note: Cataloged from appl. only
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