Text Registration
Copyright Title
PDF-4+ 2018
Status
Published
on 15 Sept 2017
Year of Creation
2017
Copyright Claimant
JCPDS - International Centre for Diffraction Data
Registration Number
TX0008473051
on 15 Sept 2017Copyright Summary
The U.S. Copyright record (Registration Number: TX0008473051) dated 15 Sept 2017, pertains to an electronic file (eService) titled "PDF-4+ 2018" created in 2017. The copyright holder is JCPDS - International Centre for Diffraction Data, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to JCPDS - International Centre for Diffraction Data.
Application Details
Registration Number
TX0008473051
Registration Date
9/15/2017
Year of Creation
2017
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
JCPDS - International Centre for Diffraction Data
Physical Description
DVD + Print material
First Publication Nation
United States
ISSN
1539-333x
Preexisting Material
Previous Work
Personal Authors
Notes
Rights Note: JCPDS - International Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, PA, 19073, United States, (610) 325-9814
Material Matter Claimed Note: computer program, Compilation of crystallographic, diffraction, and physical property data
Previous Registration Note: 2016, TX 8-356-4682015, TX 8-398-918
Statements
Application Title Statement: PDF-4+ 2018
Author Statement: JCPDS - International Centre for Diffraction Data employer for hire Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data E. Alekseeva Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data E. Antipov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data N. Audebrand Citizenship: France Authorship: Compilation of crystallographic, diffraction, and physical property data A. Babaryk Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data V. Baumer Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data R. Ben Hassen Citizenship: Tunisia Authorship: Compilation of crystallographic, diffraction, and physical property data I. Bushmarinov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data X. Chen Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data L. Fang Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data R. Gladyshevskii Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data A. Gribanov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data W. He Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data S. Ivanov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data J. Kaduk Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data E. Khaikina Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data G. Kimmel Citizenship: Israel Authorship: Compilation of crystallographic, diffraction, and physical property data S. Kirik Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data E. Knyazev Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data W. Lasocha Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data B. Lazoryak Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data S.-F. Lin Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data A. Morozkin Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data S. Pagola Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data R. Papoular Citizenship: France Authorship: Compilation of crystallographic, diffraction, and physical property data R. Pazout Citizenship: Czech Republic Authorship: Compilation of crystallographic, diffraction, and physical property data A. Puzan Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data M. Qin Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data P. Rao Citizenship: India Authorship: Compilation of crystallographic, diffraction, and physical property data T. Shkarina Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data B. Tataryn Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data L. Vasylechko Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data X. Yao Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data I. Zanin Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data I. Zavaliy Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data H. Zhang Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data
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