Text Registration
Copyright Title
PDF-4+ 2015
Status
Published
on 2 Oct 2015
Year of Creation
2015
Copyright Claimant
JCPDS - International Centre for Diffraction Data
Registration Number
TX0008398918
on 2 Oct 2015Copyright Summary
The U.S. Copyright record (Registration Number: TX0008398918) dated 2 Oct 2015, pertains to an electronic file (eService) titled "PDF-4+ 2015" created in 2015. The copyright holder is JCPDS - International Centre for Diffraction Data, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to JCPDS - International Centre for Diffraction Data.
Application Details
Registration Number
TX0008398918
Registration Date
10/2/2015
Year of Creation
2015
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
JCPDS - International Centre for Diffraction Data
Physical Description
DVD-ROM
First Publication Nation
United States
ISSN
1539-333x
Preexisting Material
Computer program, Compilation of crystallographic, diffraction, and physical property data
Personal Authors
Notes
Rights Note: JCPDS - International Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, PA, 19073, United States, (610) 325-9814
Local Copyright Note: C.O. correspondence
Material Matter Claimed Note: Computer Software/Program; Compilation of crystallographic, diffraction, and physical property data
Previous Registration Note: 2014, TX 8-033-1202013, TX 7-829-513
Statements
Application Title Statement: PDF-4+ 2015
Author Statement: JCPDS - International Centre for Diffraction Data employer for hire Citizenship: United States Authorship: Computer Software/Program; Compilation of crystallographic, diffraction, and physical property data E. Alekseeva Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data E. Antipov Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data N. Audebrand Citizenship: France Authorship: Compilation of crystallographic, diffraction, and physical property data N. Babitskii Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data T. Bataille Citizenship: France Authorship: Compilation of crystallographic, diffraction, and physical property data V. Baumer Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data R. Ben Hassen Citizenship: Tunisia Authorship: Compilation of crystallographic, diffraction, and physical property data I. Bushmarinov Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Che Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data X. Chen Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data V. Chernyshev Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data L. Fang Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data R. Gladyshevskii Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data G. Golovnev Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data A. Gribanov Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data D. Havlicek Citizenship: Czech Republic Authorship: Compilation of crystallographic, diffraction, and physical property data W. He Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data S. Ivanov Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data S. Jin Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data S. Jun Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data J. Kaduk Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data O. Kammoun Citizenship: France Authorship: Compilation of crystallographic, diffraction, and physical property data G. Kimmel Citizenship: Israel Authorship: Compilation of crystallographic, diffraction, and physical property data S. Kirik Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data E. Knyazev Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data X. Lai Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data W. Lasocha Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data E. Levin Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data S.-F. Lin Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data G. Liu Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data A. Morozkin Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data R. Mulagaleev Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data E. Olszewska Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data S. Pagola Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data R. Pazout Citizenship: Czech Republic Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Peng Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data H. Poellmann Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data M. Qin Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data A. Rammohan Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data P. Rao Citizenship: India Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Seropegin Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Seryotkin Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data S. Shen Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data A. Shiryaev Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data T. Shkarina Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data K. Talley Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Tang Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data B. Tataryn Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data Y.-J. Tsai Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data L. Vasylechko Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data Z. Wei Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data W. Wong-Ng Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data X. Wu Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Xu Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data X. Yao Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data T. Ying Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data I. Zanin Citizenship: Russia (Federation) Authorship: Compilation of crystallographic, diffraction, and physical property data I. Zavaliy Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data H. Zhang Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data Q. Zhao Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data O. Zhbankov Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data J. Zheng Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data O. Zmii Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data
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