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IEEE Standard for Test Methods and Performance of Low-Voltage (1000 V rms or Less) Surge Protective Devices Used on Secondary Distribution Systems (Between the Transformer Low-Voltage Terminals and the Line Side of the Service Equipment)
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Copyright Title

IEEE Standard for Test Methods and Performance of Low-Voltage (1000 V rms or Less) Surge Protective Devices Used on Secondary Distribution Systems (Between the Transformer Low-Voltage Terminals and the Line Side of the Service Equipment)

Status

Published

on 30 May 2018
Year of Creation
2017
Registration Number
TX0008596778
on 30 May 2018

Copyright Summary


The U.S. Copyright record (Registration Number: TX0008596778) dated 30 May 2018, pertains to an electronic file (eService) titled "IEEE Standard for Test Methods and Performance of Low-Voltage (1000 V rms or Less) Surge Protective Devices Used on Secondary Distribution Systems (Between the Transformer Low-Voltage Terminals and the Line Side of the Service Equipment)" created in 2017. The copyright holder is Institute of Electrical and Electronics Engineers, Inc, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Institute of Electrical and Electronics Engineers, Inc.

Application Details


Registration Number
TX0008596778
Registration Date
5/30/2018
Year of Creation
2017
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Institute of Electrical and Electronics Engineers, Inc
Physical Description
Print material, 38 p
First Publication Nation
United States
Preexisting Material
text

Notes


Rights Note: Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ, 08854, United States
Material Matter Claimed Note: text

Statements


Application Title Statement: IEEE Standard for Test Methods and Performance of Low-Voltage (1000 V rms or Less) Surge Protection Devices Used on Secondary Distribution Systems (Between the Transformer Low-Voltage Terminals and the Line Side of the Service Equipment)
Author Statement: Institute of Electrical and Electronics Engineers, Inc employer for hire Domicile: United States Citizenship: United States Authorship: text
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