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P2ID 2003 8th International Symposium on plasma- and process-induced damage : April 24-25, 2003, Corbeil-Essonnes, France Koji Eriguchi, S. Krishnan, and Terence Hook, editors
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P2ID 2003 8th International Symposium on plasma- and process-induced damage : April 24-25, 2003, Corbeil-Essonnes, France Koji Eriguchi, S. Krishnan, and Terence Hook, editors

Status

Published

on 14 Jun 2007
Year of Creation
2003
Registration Number
TX0005741780
on 14 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0005741780) dated 14 Jun 2007, pertains to an electronic file (eService) titled "P2ID 2003 8th International Symposium on plasma- and process-induced damage : April 24-25, 2003, Corbeil-Essonnes, France Koji Eriguchi, S. Krishnan, and Terence Hook, editors" created in 2003. The copyright holder is Institute of Electrical and Electronics Engineers, Inc. (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Institute of Electrical and Electronics Engineers, Inc. (employer for hire).

Application Details


Registration Number
TX0005741780
Registration Date
6/14/2007
Year of Creation
2003
Place of First Publication
New York
Publisher Name
IEEE
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Institute of Electrical and Electronics Engineers, Inc
Physical Description
189 p
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