Proceedings of the 1997 6th international symposium on the physical & failure analysis of integrated circuits edited by M. K. Radhakrishnan, Philip Ho, Chim Wai Kin

Text Registration

Proceedings of the 1997 6th international symposium on the physical & failure analysis of integrated circuits edited by M. K. Radhakrishnan, Philip Ho, Chim Wai Kin

Status

Published

on 14 Jun 2007

Year of Creation

1997

Institute of Electrical and Electronics Engineers, Inc. (employer for hire)

Registration Number

TX0004748130

on 14 Jun 2007

The U.S. Copyright record (Registration Number: TX0004748130) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Proceedings of the 1997 6th international symposium on the physical & failure analysis of integrated circuits edited by M. K. Radhakrishnan, Philip Ho, Chim Wai Kin" created in 1997. The copyright holder is Institute of Electrical and Electronics Engineers, Inc. (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Institute of Electrical and Electronics Engineers, Inc. (employer for hire).

Institute of Electrical and Electronics Engineers, Inc. (employer for hire)

Application Details

Registration Number

TX0004748130

Registration Date

6/14/2007

Year of Creation

1997

Agency Marc Code

DLC-CO

Record Status

New

Corporate Author

Institute of Electrical and Electronics Engineers, Inc

Physical Description

301 p

Personal Authors

M. K Radhakrishnan

Philip Ho

Wai Kin Chim

Corporate Authors

Inc Institute of Electrical and Electronics Engineers

Notes

Bibliographic Note: Cover ti.: 6th international symposium on the physical & failure analysis of integrated circuits & IPFA '97 proceedings

Statements

Application Title Statement: 1997 6th international symposium on the physical & failure analysis of integrated circuits, Jul 21, 1997/Singapore

Notes

Bibliographic Note: Cover ti.: 6th international symposium on the physical & failure analysis of integrated circuits & IPFA '97 proceedings

Statements

Application Title Statement: 1997 6th international symposium on the physical & failure analysis of integrated circuits, Jul 21, 1997/Singapore

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