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Proceedings 2004 IEEE International workshop on current & defect based testing (DBT 2004) : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA edited by Sankaran Menon, Jim Plusquellic, Adit Singh, Hans Manhaeve
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Proceedings 2004 IEEE International workshop on current & defect based testing (DBT 2004) : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA edited by Sankaran Menon, Jim Plusquellic, Adit Singh, Hans Manhaeve

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Published

on 15 Jun 2007
Year of Creation
2004
Copyright Claimant
IEEE
Registration Number
TX0006096123
on 15 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0006096123) dated 15 Jun 2007, pertains to an electronic file (eService) titled "Proceedings 2004 IEEE International workshop on current & defect based testing (DBT 2004) : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA edited by Sankaran Menon, Jim Plusquellic, Adit Singh, Hans Manhaeve" created in 2004. The copyright holder is IEEE, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to IEEE.

Copyright Details


Copyright Claimant
IEEE

Application Details


Registration Number
TX0006096123
Registration Date
6/15/2007
Year of Creation
2004
Place of First Publication
Piscataway, NJ
Publisher Name
IEEE
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
IEEE
Physical Description
112 p

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Application Title Statement: 2004 IEEE International workshop on defect based testing
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