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ANSI/ESD SP5.3.3-2018 - ESD Association Standard Practice for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) Testing - Component Level - Low-Impedance Contact CDM As an Alternative CDM Characterization Method
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Copyright Title

ANSI/ESD SP5.3.3-2018 - ESD Association Standard Practice for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) Testing - Component Level - Low-Impedance Contact CDM As an Alternative CDM Characterization Method

Status

Published

on 15 May 2020
Year of Creation
2019
Copyright Claimant
EOS/ESD Association, Inc
Registration Number
TX0008873615
on 15 May 2020

Copyright Summary


The U.S. Copyright record (Registration Number: TX0008873615) dated 15 May 2020, pertains to an electronic file (eService) titled "ANSI/ESD SP5.3.3-2018 - ESD Association Standard Practice for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) Testing - Component Level - Low-Impedance Contact CDM As an Alternative CDM Characterization Method" created in 2019. The copyright holder is EOS/ESD Association, Inc, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to EOS/ESD Association, Inc.

Copyright Details


Copyright Claimant
EOS/ESD Association, Inc

Application Details


Registration Number
TX0008873615
Registration Date
5/15/2020
Year of Creation
2019
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
EOS/ESD Association, Inc
Physical Description
Electronic file (eService)
First Publication Nation
United States
ISBN
1-58537-306-0

Corporate Authors


Notes


Rights Note: Christina R Earl, EOS/ESD Association, Inc., 7900 Turin Road, Building 3, Rome, NY, 13440, United States, (315) 339-6937, standards@esda.org

Statements


Application Title Statement: ANSI/ESD SP5.3.3-2018 - ESD Association Standard Practice for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) Testing - Component Level - Low-Impedance Contact CDM As an Alternative CDM Characterization Method
Author Statement: EOS/ESD Association, Inc employer for hire Citizenship: United States Authorship: text
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