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Ion-induced damage in silicon a fundamental study of basic mechanisms over a wide range of implantation conditions
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Copyright Title

Ion-induced damage in silicon a fundamental study of basic mechanisms over a wide range of implantation conditions

Status

Published

on 15 Jun 2007
Year of Creation
2005
Copyright Claimant
Elaine Grannan Roth
Registration Number
TX0006470886
on 15 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0006470886) dated 15 Jun 2007, pertains to an electronic file (eService) titled "Ion-induced damage in silicon a fundamental study of basic mechanisms over a wide range of implantation conditions" created in 2005. The copyright holder is Elaine Grannan Roth, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Elaine Grannan Roth.

Copyright Details


Copyright Claimant
Elaine Grannan Roth

Application Details


Registration Number
TX0006470886
Registration Date
6/15/2007
Year of Creation
2005
Agency Marc Code
DLC-CO
Record Status
Changed
Physical Description
Computer text data

Personal Authors


Notes


Rights Note: Rights and permissions info. on CORDS appl. in CO
Local Copyright Note: Electronic registration

Statements


Author Statement: entire text: Elaine Grannan Roth
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