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Fundamental Studies of Supported Graphene Interfaces: Defect Density of States in Graphene Field Effect Transistors (FETs) and Ideal Graphene - Silicon Schottky Diodes
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Fundamental Studies of Supported Graphene Interfaces: Defect Density of States in Graphene Field Effect Transistors (FETs) and Ideal Graphene - Silicon Schottky Diodes

Status

Published

on 22 Dec 2014
Year of Creation
2014
Copyright Claimant
Dhiraj P. Sinha
Registration Number
TX0008059778
on 22 Dec 2014

Copyright Summary


The U.S. Copyright record (Registration Number: TX0008059778) dated 22 Dec 2014, pertains to an electronic file (eService) titled "Fundamental Studies of Supported Graphene Interfaces: Defect Density of States in Graphene Field Effect Transistors (FETs) and Ideal Graphene - Silicon Schottky Diodes" created in 2014. The copyright holder is Dhiraj P. Sinha, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Dhiraj P. Sinha.

Copyright Details


Copyright Claimant
Dhiraj P. Sinha

Application Details


Registration Number
TX0008059778
Registration Date
12/22/2014
Year of Creation
2014
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Electronic file (eService)
First Publication Nation
United States

Personal Authors


Notes


Rights Note: Diana G Zajic, ProQuest-CSA, LLC, 789 E. Eisenhower Parkway, Ann Arbor, MI, 48108-3218, United States, (800) 521-0600 x7020, disspub@email.com

Statements


Application Title Statement: Fundamental Studies of Supported Graphene Interfaces: Defect Density of States in Graphene Field Effect Transistors (FETs) and Ideal Graphene - Silicon Schottky Diodes
Author Statement: Dhiraj P. Sinha Citizenship: not known Authorship: text
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