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Visit USCOQuantitative analysis of extended defects at surfaces using low-energy David G. Welkie
Text Registration
Copyright Title
Quantitative analysis of extended defects at surfaces using low-energy David G. Welkie
Status
Published
on 14 Jun 2007
Year of Creation
1981
Copyright Claimant
David Gordon Welkie
Registration Number
TX0000783805
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0000783805) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Quantitative analysis of extended defects at surfaces using low-energy David G. Welkie" created in 1981. The copyright holder is David Gordon Welkie, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to David Gordon Welkie.
Application Details
Registration Number
TX0000783805
Registration Date
6/14/2007
Year of Creation
1981
Place of First Publication
Ann Arbor
Publisher Name
University Microfilms International
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Microfiche
Notes
Bibliographic Note: Order no. 81-17682
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