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Visit USCOIntegrated test structures for characterization of thin films for superconductor-insulator-superconductor devices and circuits
Text Registration
Copyright Title
Integrated test structures for characterization of thin films for superconductor-insulator-superconductor devices and circuits
Status
Published
on 14 Jun 2007
Year of Creation
1996
Copyright Claimant
Dallas Millard Lea, Jr
Registration Number
TX0004480390
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0004480390) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Integrated test structures for characterization of thin films for superconductor-insulator-superconductor devices and circuits" created in 1996. The copyright holder is Dallas Millard Lea, Jr, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Dallas Millard Lea, Jr.
Application Details
Registration Number
TX0004480390
Registration Date
6/14/2007
Year of Creation
1996
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Microfiche
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