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Influence of temperature on microelectronics and system reliability Pradeep Lall, Michael G. Pecht, Edward B. Hakim
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Copyright Title

Influence of temperature on microelectronics and system reliability Pradeep Lall, Michael G. Pecht, Edward B. Hakim

Status

Published

on 14 Jun 2007
Year of Creation
1997
Registration Number
TX0004567691
on 14 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0004567691) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Influence of temperature on microelectronics and system reliability Pradeep Lall, Michael G. Pecht, Edward B. Hakim" created in 1997. The copyright holder is CRC Press, LLC (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to CRC Press, LLC (employer for hire).

Copyright Details


Application Details


Registration Number
TX0004567691
Registration Date
6/14/2007
Year of Creation
1997
Place of First Publication
Boca Raton
Publisher Name
CRC
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
CRC Press, LLC
Physical Description
307 p
Series Statement
Electronic packaging series

Corporate Authors


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